Inan, Tolga; Halici, Ugur
(IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA, 2012)
In this paper, we present a novel automatic approach based on local shape descriptors to discriminate 3-D facial scans of different individuals. Our approach begins with registration, smoothing and uniform resampling of ...